User:Talpa
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Can the method described in [[NAND_bad_blocks#BBT_creation | BBT Creation]] does it (sort of) recreate the Factory-programmed NAND bad block information<br> | Can the method described in [[NAND_bad_blocks#BBT_creation | BBT Creation]] does it (sort of) recreate the Factory-programmed NAND bad block information<br> | ||
'''NOTE: this method probably requires a JTAG cable''' | '''NOTE: this method probably requires a JTAG cable''' | ||
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| + | ==== U-boot ==== | ||
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| + | setenv bodt_menu_timeout 3600 | ||
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| + | ./neocon -t 30 /dev/ttyACM0 | ||
Revision as of 18:00, 4 May 2009
Contents |
My notes
Debian Notes
All hail Debian...
- git repository for device configuration http://git.debian.org/?p=pkg-fso/openmoko-files.git;a=summary
- FreeSmartphone.Org packaging team page
Private index of useful pages
Interesting paths
- moko/openembedded contains the bb files for 2007.2
- moko/openmoko/trunk/src/target/OM-2007.2/ contains the src files for the OpenMoko 2007.2 apps
OpenEmbedded/bitbake
Backing up data stored on the factory Neo
Things that needs to be backed up.
- Factory-programmed NAND bad block information?
Initial Backup
Describes the backup of the 4 partitions, but does this include the factory bad block table? I think NOT
NAND_bad_blocks contains some information on the bad block information stored in the flash
Bad block notes
According to NAND_basics each flash page (512 bytes) has 16 bytes of out-of-band (OOB) data. The OOB contains different information but among other things it can mark a page? as bad.
According to Bad Block Table (BBT)
there is also a Bad Block Table that contains additional information.
Is this the same as the factory-programmed NAND bad block information discussed in Neo1973_Hardware?
Recreating the Factory-programmed NAND bad block information
Can the method described in BBT Creation does it (sort of) recreate the Factory-programmed NAND bad block information
NOTE: this method probably requires a JTAG cable
U-boot
setenv bodt_menu_timeout 3600
./neocon -t 30 /dev/ttyACM0
